Used ZYGO / IBM SXM-200 #150544 for sale

ZYGO / IBM SXM-200 scanning electron microscope (SEM) is an advanced imaging tool used for microscopic imaging in the fields of materials sciences, biology, and engineering. It has a high resolution, high throughput, and fast refresh rate. It is equipped with a new-generation FAST scan micron-spot gun, a monochrome CCD camera, and a new X-Y positioning miniaturesample stage. The SEM has a high-resolution electrostatic lens equipment which offers a detailed imaging capability. The beam electron energy is adjustable up to 30KV for imaging specimens with high levels of sensitivity, even of materials with low atomic number. The high electron beam power allows for higher resolution imaging of small features, ensuring detailed images of the specimen. IBM SXM-200 is also equipped with an automated 10mm specimen stage. This stage can move the specimen in the X and Y directions in increments of one micron, thus allowing the user to accurately image extremely small areas. This stage is also equipped with a high-resolution encoder and an absolute position control system, to ensure that even minute features are accurately captured. ZYGO SXM-200 comes with an automated unit for controlling and monitoring specimen contamination. This machine is designed to minimize the possibility of sample contamination during scanning, as well as reducing contamination of the specimen chamber between scans. In addition, SXM-200 offers a variety of optional analysis and measurement tools. The X-ray spectrometer offers a wide range of analytical capabilities, from elemental analysis to chemical analysis. The secondary and backscattering electron detectors offer high sensitivity for surface imaging, and for imaging of near-surface layers. ZYGO / IBM SXM-200 is easy to use and maintain, and it is ideal for the analysis of highly detailed material specimens. This makes it an important tool for scientists and engineers in the fields of materials sciences, biology, and engineering.