Used MICRO VU Vertex 261UC #9351521 for sale

MICRO VU Vertex 261UC
ID: 9351521
System.
MICRO VU Vertex 261UC optical comparator is a high precision thickness and form optical measuring equipment. It combines a high accuracy optical comparator and CCD camera in one compact housing. The system is ideal for measuring complex thin-gauge parts, small components, and thin-film materials, which are often found in the electronics, medical, and automotive industries. The optical comparator utilizes instantaneous imaging and instantaneous focusing for fast, accurate measurement. The unit is designed with a large high-resolution CCD camera for high-magnification imaging and focusing. Additionally, the optical comparator is fitted with high magnification optics, long-working distances, and an illuminated two-dimensional measuring scale for enhanced accuracy. The optical comparator also features a CNC platform with a 12 point touch probe for automated measurement of complex parts. It is also capable of measuring over a large field of view, making it suitable for use when measuring larger parts. The optical comparator utilizes a time-tested optical design and digital signal processing technology to ensure precise data acquisition. The machine does not require calibration and is capable of storing measurement data. It is also compatible with the latest computer vision programs for further analysis and research. Additionally, the optical comparator provides an intuitive user interface for easy set-up and operation. The tool comes with an easy-to-use Windows-based software package with an embedded 3-D graphic navigation asset. It also includes teaching mode for first time users or personnel unfamiliar with the instrument. Vertex 261UC optical comparator promises efficient and accurate measurement of thin-gauge materials with industry-standard precision and repeatability. It is fitted with all the necessary features, including CCD camera, high magnification optics, light source, CNC platform, and teaching mode, making it an ideal choice for precision thickness and form measurement of small and thin-film components.
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