Used HOLOGENIX YIS-200SP #293769606 for sale

HOLOGENIX YIS-200SP Mask & Wafer Inspection Equipment is a high-resolution, automated digital imaging system that enables the automated inspection, analysis, classification, and qualification of photolithographic masks and wafers. The unit is capable of conducting a wide range of metrology functions, providing both detailed and global images and measurements of the mask or wafer. YIS-200SP Mask & Wafer Inspection Machine is designed to inspect, measure, and inspect complex topographical structures on masks and wafers more accurately and faster than conventional optical systems. It achieves this high level of accuracy through the use of advanced optics and scan head technologies, allowing for fast scanning of a workpiece surface as well as fine positioning of the laser line in order to quantitatively measure features and patterns on the surface. It is also an ideal tool for measuring flatness, thickness stencils substrates, and other complex topographical surfaces. The tool is equipped with diffraction limited optics, allowing for a precise and accurate imaging of both large and small features on the mask. This also ensures that images captured are completely in focus, with no color anomalies. It is powered by both horizontal and vertical laser scanning capabilities as well as an angular field of view. This provides for the construction of a 3D map that contains information that describes the varied topographical features of the workpiece. HOLOGENIX YIS-200SP Mask & Wafer Inspection Asset has advanced analysis capability with options for automated detection and classification of defects, as well as manual classification and reporting of errors. Furthermore, in addition to detecting errors and defects on masks and wafers, the model also can be used to compare masks to drawings and ensure the proper functionality of masks. The equipment offers the ability to transmit images to the user's remote system for review purposes, or broadcast constantly updated images across a LAN. This ensures that the user can receive images in real-time for review and analysis, regardless of physical distance. In conclusion, YIS-200SP Mask & Wafer Inspection Unit is a powerful and versatile tool for inspecting and qualifying photolithographic masks and wafers, thanks to its advanced optics, diffraction-limited imaging, and advanced analysis capabilities. It allows for quick and accurate analysis and detection of defects and errors, as well as comparison of masks to drawings, making it an ideal choice for mask and wafer applications.