Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E5071C #293626347 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E5071C is a high-performance transmission/reflection/network analyzer that offers superior accuracy and repeatability for RF/microwave measurements. This power supply is specifically designed for testing and characterizing communications systems, components and boards. HP E5071C is equipped with a 25-Watt dc bias which allows for the accommodation of high power measurement applications. It is a versatile, one port, vector network analyzer that offers a broad range of features such as a built-in sweep generator, a built-in 16-bit PROM and an optional internal power sensor. AGILENT E5071C has an internal source which provides simultaneous source-measurement capability, enabling accurate measurement of device under test (DUT) impedance, even at low frequencies and large impedances. E5071C also features an isolation amplifier, which eliminates the need for external 50-ohm isolation amplifiers. HEWLETT-PACKARD E5071C is designed with a frequency range of up to 6.3 GHz, providing high-accuracy measurements of both magnitude and phase. KEYSIGHT E5071C has built-in calibration algorithms that simplify the calibration process and reduce measurement time. AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E5071C also includes a control software package that offers flexible control of the analyzer and can be programmed using MATLAB, Visual Basic, Visual C++, and HP Measurement Manager (AMM). AMM offers an easy-to-use graphical user interface, allowing the user to easily set the test parameters and acquire measurements. HP E5071C is an ideal instrument for measuring DUT parameters on circuit boards, modules and devices. It provides an efficient, practical solution to RF/microwave designers and engineers as it offers superior performance, repeatability, and accuracy. Its 25-Watt dc bias, internal source, and isolated amplifier make it an ideal choice for characterizing high-power applications. Additionally, its built-in PROM, sweep generator and calibration algorithms improve test accuracy and reduce overall test time.