Used ACCRETECH / TSK APM-60C #9396537 for sale

ACCRETECH / TSK APM-60C is a non-contact prober designed for probing and inspecting the electrical properties of integrated circuits. The tool provides a complete range of functions for probing and testing silicon wafers and substrates, including product evaluation, characterization, and medium-to-high volume production of integrated circuits. TSK APM-60C features a state-of-the-art Multiprobe Robotic Equipment (MRS) design. The MRS mechanism is comprised of a scanning control unit and an optical positioning system. The optical positioning unit provides extremely accurate alignment and repeatability, while the controllable scan range allows for probing and inspection of up to 600 dies per die. The systems non-contact measurement technology is capable of accurately detecting part-to-part variation by measuring individual junction capacitance and resistance. This is aided by the use of advanced algorithms for analyzing signal waveforms and determining potential profile variations. Other key features of ACCRETECH APM-60C include high speed data acquisition, a dynamic data processor, and a color video monitor. The data acquisition machine allows for rapid measurements of voltage and current waveforms, while the data processor simplifies the interpretation of the measured waveforms for the operator. The color video monitor makes it easier to closely inspect the probes position and alignment. APM-60C is an efficient and versatile inspection and probing tool, suitable for a wide range of IC designs and levels of complexity. Its highly precise probing and measuring capabilities, in combination with its wide range of probing capabilities, make it an ideal tool for characterization, assembly verification and defect analysis. It is an effective solution for increasing IC process yields through reduction of costs related to defective products.