Used ACCRETECH / TSK APM-90A #136392 for sale

Manufacturer
ACCRETECH / TSK
Model
APM-90A
ID: 136392
Automated wafer prober, 8" Currently wrapped and stored 1997 vintage.
ACCRETECH / TSK APM-90A is a high-precision, automated prober with quick maneuverability and a compact footprint. TSK APM90A is designed to provide precise and accurate probing capabilities for a variety of materials including non-metallic and conductive substrates such as MEMS devices. Featuring a unique modular design, ACCRETECH APM 90A is capable of relocating quickly also enabling over ten configurations optimizing performance. It also includes an integrated motorized probe head, allowing for fast and precise samples testing. Featuring a measurement accuracy of three microns, TSK APM 90A is built with exceptional Repeatability, and Stability. This allows for the detection of critical measurements in low-volume production or small batches. Additionally, ACCRETECH / TSK A PM 90 A offers advanced data acquisition with custom designed options for thermal testing, monitoring, scanning and imaging. APM90A is equipped with active vibration isolation and a vacuum head, reducing environmental noise. This dimension and improves the accuracy of measurements during testing. The integrated airflow control reduces thermal or temperature and dissipates infrared heat during testing, further increasing accuracy. APM-90A is also equipped with numerous fixture options, offering enhanced flexibility for testing and handling samples of varying sizes. Furthermore, ACCRETECH / TSK A-PM-90A is integrated with sample-in-place sub-micron resolution test capabilities. This option allows probes to measure samples while they are in place and eliminates the need to move them between the test area and prober. ACCRETECH / TSK APM 90A is a state-of-the-art prober capable of providing precise and accurate measurements for a variety of samples. Its unique modular design and advanced capabilities allow for quick and precise testing, reducing the time and effort required to identify and monitor critical measurements in low-volume production and small batches.
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