Used ACCRETECH / TSK APM-90A #293633226 for sale

ACCRETECH / TSK APM-90A is a fully automated optical prober meant for wafer measurement and material surface analysis. It features a unique, ergonomic design that allows for easy loading, unloading and multiple configuration options. TSK APM90A has an advanced probe head that offers a high sampling rate for faster and more accurate measurements. A robotic arm allows for instantaneous, precise and repeatable wafer picking in a stable environment. A unique feature is the "armless feature" which allows for expanded applications. An integrated touch-sense technology provides accurate force control during probing ensuring exact results when in contact with the sample. High resolution optics is also featured which allows for repeatable, reliable and accurate measurements. The laser scanner provides fast scanning speeds of up to 100K points per second. A built-in focus controller provides reliable depth focus while a piezo-z scanner provides high resolution measurements with a maximum speed of 5GHz readings per second. An industry-leading 1.2µm closed-loop servo motor provides 3-axis movement of the wafer sample and wafer chuck with precision and accuracy. The card-controlled open loop XY motion allows for smooth motion control with a maximum velocity of 300mm/s and acceleration of 1.8G. Its user-replaceable blades minimize blade replacement costs, providing a cost-effective solution for complex applications. The integrated, modular imaging package and analysis software provide complete surface analysis package. A comprehensive event control system is able to automatically control and manage a large quantity of processes, from initial wafer probing to data processing and measuring. For safety, an emergency stop button is also integrated, restoring start-up conditions after a power down. ACCRETECH APM 90A is designed to provide reliable, accurate and efficient measurement and analysis of wafers and material surfaces. It is highly efficient at analyzing large volumes of data quickly and accurately, providing a superior solution for complex analysis.