Used ACCRETECH / TSK APM-90A #293633233 for sale

ACCRETECH / TSK APM-90A is a multi-functional combination prober and metrology tool designed to maximize performance in advanced wafer probing, thin wafer handling, and surface defect inspection. With an industry-leading nanoscale resolution accuracy, TSK APM90A is particularly well suited for critical process monitoring and characterization of devices with a maximum thickness of 90 μm. ACCRETECH APM 90A utilizes a proprietary multi-all-in-one (MAIO) technology combining mechanical, optical and electrical systems into one integrated package. This intuitive design offers improved cost savings and efficiency in comparison to separately purchased components. Additionally, its ability to host multiple devices simultaneously allow for automated sample handling and inspection of up to 24 devices at a time. With the built-in high-speed spindle-based mechanical prober equipment, samples can be inspected quickly and accurately with a high throughput rate of up to 30 wafers per hour. ACCRETECH A PM 90 A's optical capabilities include an automated optical microscopy module with an advanced image recognition system that can detect particles and surface defects with a minimum size as small as 1μm. With 24 light sources, each with its own CCD camera, the unit can be customized with a selection of microscopes and polarization filters to optimize detection range and signal-to-noise ratio. The electrical machine of TSK A-PM-90A is comprised of a multi-channel electrical microprober with up to 24 signal lines and 4 power lines, A/D/C, digital I/O and dynamic ranging. All inputs and outputs can be automatically mapped and characterized in a matter of milliseconds and can be customized according to test type and device complexity. The state-of-the-art microprober tool supports a wide variety of device interfaces and is equipped with a various measurement techniques to ensure repeatable and reliable results. ACCRETECH / TSK APM 90A is a reliable and efficient prober and metrology tool, offering advanced measurement and inspection capabilities. With its intuitive design and wide range of probing and testing options, APM90A is an ideal solution for critical process monitoring and characterization of thin wafers or devices with a maximum thickness of 90 μm.