Used ACCRETECH / TSK APM-90A #9191015 for sale

Manufacturer
ACCRETECH / TSK
Model
APM-90A
ID: 9191015
Auto prober Nickel hot chuck, 8" X and Y moire scales.
ACCRETECH / TSK APM-90A is a semiconductor prober specifically designed for wafer probing, IC testing, and module testing. It is equipped with the ultraprecise XYZ-axis positioning equipment and submicron XY-motor movement which support a method of sample alignment where a wafer is gently placed onto boxes and probed exactly as required. TSK APM90A features a shield structure and air-bearing modules that provide a highly stable environment. This helps minimize vibrations and enables accurate probing as high as 0.02 microns. The prober also supports a variety of external communications, such as RS232C and IEEE, enabling users to exchange probing data between the prober and the host computer or process development systems (PDS). Users are also able to transfer all probing data in ASCII files or compressed ASCII files. Additionally, ACCRETECH APM 90A can recognize several models of handler/equipment sets installed on the line as well as control and collect probing data from each of them. The prober is equipped with a powerful vibration reduction system to reduce the effects of external vibration. The unit makes use of precision XYZ-axis simultaneously to realize a highly stable spectral environment by applying correction values from a low range to a high range. The machine also supports alarms and pre-alarm settings at various stages of the probing cycle. In addition to its features, A-PM-90A also offers an advanced self-diagnostic function and control software. The self-diagnostic function notifies the user regarding errors that occur during a probing operation and allows for a quick and accurate repair. The control software helps avoid an overload of the tool and provides users with a high degree of control of the prober. ACCRETECH / TSK APM 90 A is a highly precise and reliable prober designed to reduce the effects of external vibration and provide a highly stable environment during wafer probing, IC testing, and module testing. Its advanced features provide users with the confidence to quickly and accurately carry out their probing operations.
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