Used ACCRETECH / TSK APM-90A #9211213 for sale

Manufacturer
ACCRETECH / TSK
Model
APM-90A
ID: 9211213
Prober Wafer sensor on elevator defect.
ACCRETECH / TSK APM-90A is a high-performance prober designed for semiconductor wafer inspection. Its automated probing capability is perfect for searching for embedded defects in wafer production, ensuring a consistent product quality. TSK APM90A is a highly sensitive, multi-channel probe equipment, featuring a dedicated vibration isolation environment and variable step/feed speed. Its advanced control and measurement system provides high levels of repeatability and accuracy to ensure reliable and consistent measurements. With its integrated stand-alone PC and graphic user interface, ACCRETECH APM 90A offers great flexibility and user-friendliness. ACCRETECH APM-90A is constructed with a precision-aligned X3-Y3 stage unit, combined with a high-resolution CCD camera for signal acquisition. Additionally, the machine features an exclusive XYZ coaxial alignment detector and an active anti-collision avoidance mechanism. A PM 90 A has a wide inspection range that covers all current package types, with a selectable field of view, zoom control, and various magnification levels. ACCRETECH / TSK APM90A's measurement technology is equipped with advanced optics and tweezers, affording users a wide range of probing operations, from high-speed scan to very fine probing, local to global probing operations. It also features dual beam processing systems for high-speed signal acquisition and analysis—able to detect micro-circuit and polarity errors, as well as sensitive low-level circuit nodes. ACCRETECH A-PM-90A is easily upgradable with an additional electric z-axis, making it suitable for wafers with different thickness or topography. For further flexibility, the prober is equipped with a block stageselect mechanism and a detachable stage housing, enabling users to freely exchange or implement different stage types. It supports up to 32 laser- to-contact probe units and 33 integrally formed probe cards, with an increased number of contact points. TSK APM 90A is an advanced, automated probe tool that offers a great degree of flexibility for accurate and reliable wafer inspection. With its comprehensive probing operations, user-friendly interface, high-precision technology, and easy upgradability, APM 90A is an ideal solution for semiconductor wafer production.
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