Used ACCRETECH / TSK APM-90A #9251028 for sale

ACCRETECH / TSK APM-90A
Manufacturer
ACCRETECH / TSK
Model
APM-90A
ID: 9251028
Vintage: 1994
Prober 1994 vintage.
ACCRETECH / TSK APM-90A is a semiconductor device prober designed to support various test and measurement requirements in semiconductor device research, development and manufacturing. This prober can be used to test and measure devices in a variety of different stages and manufacturing processes. TSK APM90A comes equipped with a 2-axis wafer stage that allows for high precision, long-term and stable motion and positioning of wafers. This stage is driven by a high-accuracy positioning equipment, which ensures a steady and predictable scan of the entire wafer surface during test and measurement procedures, which in turn helps to maximize yield and reduce incorrect readings and premature device aging. ACCRETECH APM 90A is equipped with an integrated vision control system that enhances scanning accuracy and lowers the number of incorrect readings. The integrated vision control unit also provides easy wafer alignment, accurate wafer position detection, and automated wafer loading for maximum efficiency and ease of use. This prober is equipped with an advanced and fully programmable electrical test machine, enabling it to support a wide variety of tests and measurements. The advanced automated electrical test tool allows fast testing and measurement while ensuring high test readability and data accuracy. The high degree of user-defined control allows for rapid generation of test signals, frequency sweeps, and even parallel testing, allowing users to conduct a variety of advanced tests at the same time. TSK A-PM-90A supports a wide range of probing strategies, including Tip/Tilt/Contact, AC/DC probing, single/multiple probing, and simple-contact probing. This prober also supports multiple probe cards, allowing for easier setup and reduced tooling cost for multiple products. ACCRETECH A PM 90 A is a high-end prober designed to meet the most demanding semiconductor device testing requirements. Its advanced features, coupled with its stable and precise performance, make it an ideal solution for small-scale or large-scale production environments.
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