Used ACCRETECH / TSK APM-90A #9255658 for sale

ACCRETECH / TSK APM-90A is a prober specially designed for semiconductor and electronic device probing. It is a fully automatic wafer and component prober that is capable of measuring device characteristics of miniscule components. TSK APM90A is equipped with a high-speed Z-axis control to ensure accurate and repeatable probe contact. The auto-load feature further improves accuracy and allows for high-speed testing and reduced human error. The prober also features an optical encoder and dynamic feedback system, which can improve test speed while still providing accurate contact measurements. The prober has a high-accuracy X-Y-Z level stage for fast and accurate measurement for small device probing. The stage also supports up to 4 axes, allowing multiple probes to operate simultaneously. It also comes with an Anti Slip table surface to reduce vibration and unwanted movement of the prober. The robust construction of the prober includes a nonmagnetic PWB rack and aluminum frame. Additionally, it features a fully adjustable wafer cassette holder, semiconductor fixture and sample gyroscope. Additionally, ACCRETECH APM 90A has a 6-layer with CCD optical microscope and radial illumination system for clear viewing of sample and device probes. TSK A PM 90 A is compatible with a wide range of semiconductor and electronic device testing standards such as Telcordia's GR-196, ISO/IEC10605 and IEC60586. The prober has a low electrical noise performance and low power consumption, making it suitable for use in crowded laboratories and cleanroom environments. ACCRETECH A PM 90 A also includes an easy-to-use GUI-based control software, enabling user friendly programming and operation. It also supports automated load and unload for fast probing cycles. Overall, ACCRETECH / TSK A-PM-90A is a high-performance and reliable prober, ideal for semiconductor and electronic device testing and production. Its advanced features and excellent precision make it a perfect choice for quick, accurate and repeatable device probing.