Used ACCRETECH / TSK APM-90A #9352599 for sale

Manufacturer
ACCRETECH / TSK
Model
APM-90A
ID: 9352599
Wafer Size: 6"-8"
Vintage: 1997
Prober, 6"-8" 1997 vintage.
ACCRETECH / TSK APM-90A is an advanced prober and metrology tool used for testing and inspecting semiconductor devices, particularly bumps, flip chips, and other small components. TSK APM90A operates with a wide variety of tips, including soft and hard coat, as well as styling and scratching tools. It has a nanometer-level x, y, and z movement accuracy and programmable actuation patterns, providing repeatability and precision when probing and inspecting devices. ACCRETECH APM 90A has an advanced auto-focus feature, which enables it to automatically adjust to different heights within a few micrometers, allowing for accurate and reliable probing regardless of the device positioning. It also offers different microscope configurations, from long-working distance optical to tilted view, for maximum accuracy and ease of use. ACCRETECH APM90A features an easy-to-use computer interface and a variety of complex algorithms and probing strategies. This makes it an ideal tool for performing a wide range of tests, such as electrical parameter measurements, mechanical stress tests, material characterization tests, and various failure analysis techniques. APM 90 A also includes a unique linear contact mode wafer prober. This allows the user to perform various electrical measurements while being regulated by the same positioning accuracy and control parameters used to perform mechanical tests. The combination of this feature and TSK A PM 90 A's measuring capability and precision make it a versatile instrument. TSK APM-90A performs inspections quickly and accurately with its auto-grasp drive system and its high-capacity D/A converter. This system supports high-capacity pattern measurement with a high frequency, enabling probing of areas such as bumps, flip-chips, wafers, and other areas of concern not possible with manual inspection. Furthermore, APM 90A is equipped with integrated digital inspection software, which simplifies the data-analysis process and reduces the time necessary to extract meaningful results. Overall, TSK APM 90A is a robust and highly capable prober and metrology tool. With its repeatable and precise testing and inspection capability, as well as its integrated software for data analysis and complex algorithms for testing, TSK APM 90 A is an ideal solution for those requiring accurate inspection and testing of small components.
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