Used ACCRETECH / TSK APM-90A #9396522 for sale

ACCRETECH / TSK APM-90A is a fully automated 2D/3D prober that was designed for wafer probing and measurement. This prober features a needle-type vacuum vacuum pick-up, which provides reliable wafer handling and accuracy. TSK APM90A is highly accurate, with a repeatability of 0.1µm and a nano-level measurement accuracy. It also features fine motions (moving speed of 3µm/second) and a compliant motion system (with a stroke length of up to 20mm). The prober has a stand-alone automatic calibration system that allows the microscope to be quickly calibrated with no manual intervention. ACCRETECH APM 90A's design includes an extensive range of application software, which includes overlay calibration, wafer mapping, RGB image display, and automatic focus adjustment. It is equipped with an X-Y-θ stage with a large field of view to provide exceptional resolution and throughput, while maintaining a high level of uniformity. The prober is capable of performing various types of measurements, including overlay and die-to-die; ide-to-edge; chip-to-chip; and 3D scanning. Furthermore, it is designed to be easily programmed and capable of executing macros in a variety of languages. The prober also features an open-frame configuration, allowing for quick installation and efficient operation. It is compatible with a variety of interfaces including Ethernet, USB, GPIB, and RS-232. Furthermore, ACCRETECH / TSK APM 90 A is CE Mark certified and can be used with a variety of substrates, including glass, sapphire, and silicon. In addition to its high throughput and accuracy, ACCRETECH / TSK APM 90A is highly reliable and durable. It is designed to resist heat, dust, and vibration. The prober has a long service life, and includes an extensive warranty. The unit is also built with Eco-friendly materials, making it energy efficient and reducing its environmental impact. Overall, APM-90A is an advanced, high-end 2D/3D prober with many features that give it an advantage over competing models. It offers high throughput, accuracy, and reliability, offering an optimal solution for wafer probing and measurement. It's design makes is easy to program and operate, allowing for efficient and accurate performance.