Used ACCRETECH / TSK APM-90A #9401993 for sale

ACCRETECH / TSK APM-90A is an automated prober designed for precise, high-speed sampling and probing of wafers. This device features the precise and reliable probing technologies developed by TSK, making it suitable for a variety of wafer and other substrate probing applications. TSK APM90A is equipped with two sets of probing and measuring arms, allowing it to sample two different parts of the same wafer at the same time. This significantly reduces the time required to measure multiple points on a single substrate. ACCRETECH APM 90A is equipped with four Z axes and utilizes a range of motion of 300x300mm, enabling precise and efficient probing operations. Additionally, its probe card has a capacity of more than 1000 probes, allowing it to measure a wide range of test points. ACCRETECH A-PM-90A is designed for rapid, precise and repeatable wafer probing applications. The device has eight dynamically adjustable sets of wafer-contact positions, enabling precise and repeatable contact between the probe arms and the wafer surface. TSK A PM 90 A also features an advanced automatic heating sub-system, which ensures accurate and repeatable measurement of sample temperatures. In addition, the prober has a high-definition image processing system, which transmits images to a user terminal for simplified measurement data analysis. ACCRETECH A PM 90 A is designed to be easily integrated into existing production processes, allowing for rapid and efficient data acquisition. The device is designed for use in harsh environment, and features an extremely high level of stability, within a temperature range of -95℃ to 145℃. In addition, ACCRETECH APM 90 A is supported by an extensive suite of software and hardware, enabling users to rapidly traverse the probing landscape and access vital information needed to complete their task accurately and efficiently. This comprehensive software suite eases the process of programming, as well as communicating with external systems, including microscope systems. With an expertly designed linear-drive system, TSK APM-90A ensures superior performance during wafer probing operations. The prober is also capable of measuring and recording multiple probes simultaneously, allowing for a more efficient and productive process. Overall, ACCRETECH APM-90A is a high-performance, feature-rich prober suitable for a wide range of wafer probing applications. Its precision, accuracy and repeatability, along with its comprehensive software package, make this device an ideal choice for any substrate probing operations.