Used ACCRETECH / TSK APM-90AF #293703113 for sale

ACCRETECH / TSK APM-90AF is a wafer prober that is used for probing and testing integrated circuits on individual wafers. The machine is capable of testing up to 1,000 wafers per hour, and is equipped with a variety of probing technologies, including electrical, optical and thermal probing. The prober is highly configurable and can be used for a variety of tests and applications. TSK APM-90AF features an 10-inch wafer carrier with a 2.5-inch total scanning range and a 4.5-inch diameter glass nozzle. The prober has a maximum electrical test speed of 800 MHz and a maximum thermal test speed of 200Hz. The prober also features an absolute mechanical positioning equipment, which enables quick and accurate placement of probes on the wafer surface. The prober is compatible with various semiconductor parametric test systems, including wafer level package test systems and wafer level reliability test systems. The prober provides a wide variety of interfaces, including one data bus connector, two serial ports, and one I/O port. The prober is equipped with a variety of advanced features that make it ideal for testing high-density circuits. The prober has a built-in Z head tool, which enables up to six times faster probing than a conventional probe head. The prober also features AutoFinger™, a sophisticated probing system that can handle batch manufacturing of wafers with different processes. The prober has an integrated ECCS (Electronic Cooling Control Unit) that enables accurate temperature control during probing, testing, and sorting of wafers. The prober also features a command language interface, which allows users to program the prober to customize the test process and routines. In addition to its advanced features, ACCRETECH APM-90AF has a robust and reliable design. The prober is equipped with an error diagnostic machine that can detect and alert users to any errors that may occur during the test process, allowing users to quickly identify and address any issues before they affect the test results. APM-90AF is a highly configurable, reliable and efficient prober that is ideal for testing and probing integrated circuits on individual wafers. The prober's advanced features make it the perfect tool for the most demanding semiconductor test jobs.