Used ACCRETECH / TSK FP 3000 #293637098 for sale

ACCRETECH / TSK FP 3000 is a technologically advanced, top-of-the-line prober equipment designed for high precision probing and testing of semiconductor devices. It features a range of integrated diagnostics and analysis tools that allow for the testing of advanced semiconductor devices in a more comprehensive way than traditional test methods. The system is equipped with a 4-axis XYZT wafer prober stage that offers fast and accurate motion control, allowing for high-speed processes across a variety of substrate sizes. Furthermore, the unit also employs various diagnostics tools in order to achieve the highest level of precision and accuracy. These tools include advanced vision systems for edge alignment, optical microscopy for defect analysis, advanced electrical testing core for FET and MOSFET testing, and laser-based imaging for defect classification and analysis. The advanced vision capabilities of TSK FP 3000 allow for improved sight control, enabling faster and more accurate alignment of the wafer and components. Additionally, the machine also features an optical tool to ensure optimum viewing of the device surface while wafer handling is taking place. Additionally, the asset's optical microscopy tools can detect defects down to a few microns and help classify them into various categories such as shorts, opens, and/or other complex defects. Furthermore, the model comes with built-in electrical testing capabilities for FET and MOSFET testing, meaning that devices made with those technologies can be tested more efficiently and accurately than if traditional test methods were used. Additionally, the equipment also offers laser-based imaging capabilities, making it easier to identify, classify, and analyze defects on wafers and devices. In short, ACCRETECH FP 3000 is an ideal prober system for any manufacturer or researcher in need of an advanced and reliable testing tool. Its features and capabilities ensure the highest level of accuracy and efficiency when it comes to checking and testing semiconductor devices. This unit offers maximum precision, output, reliability, and flexibility in order to ensure optimal results.