Used ACCRETECH / TSK MHF 300 #9243758 for sale

ACCRETECH / TSK MHF 300
Manufacturer
ACCRETECH / TSK
Model
MHF 300
ID: 9243758
Manipulators For UF 200.
ACCRETECH / TSK MHF 300 is a prober designed to accurately and quickly measure the parameters of wafers, ICs, and other semiconductor devices. It is a fully automated equipment capable of high-precision probing and testing of 3D ICs. The prober includes a number of hardware and software components, including a 7-layer cross-sectional vertical plane and an on-board data processing system, to deliver precise and efficient measurement results. The vertical plane of TSK MHF 300 consists of a fixture, adjustable spacer, induction pinhead, and air pads. The fixture is a platform for accommodating the IC or wafer. The adjustable spacer is designed to fit the width of the IC or wafer, allowing the placement of the pinhead. The induction pinhead holds aligned pins that are inserted in the wafer/IC to measure its parameters. The air pad helps prevent any undesired contact between the pinhead and the IC/wafer. ACCRETECH MHF 300 has an on-board data processing unit, which includes a field-programmable gate array (FPGA), an application-specific integrated circuit (ASIC) and a data trace controller chip (TTC). This machine ensures fast and accurate analysis of data, providing precise measurement results. The FPGA allows data to be rapidly processed while the ASIC compiles the data to generate real-time results. The TTC enables the storage and analysis of multiple data samples collected during the measurement process. Additionally, MHF 300 offers a high dynamic range and wide frequency response. The pins used in the prober are equipped with a five-gigapixel camera, allowing for high-precision measurements. The camera is also utilized to detect fine motions and small displacements to ensure accurate results. Additionally, ACCRETECH / TSK MHF 300 supports temperature tests, enabling the assessment of temperature-dependent parameters and phenomena. TSK MHF 300 is an effective tool for precise and efficient testing of wafers, ICs, and other semiconductor devices. Its vertical plane and on-board data processing tool ensure accurate data measurement and analysis, while its high dynamic range and wide frequency response provide precise results. With the help of the camera and temperature tests, it is able to effectively detect small differences and disturbances to obtain more accurate results.
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