Used ACCRETECH / TSK MHF 300 #9353911 for sale

ACCRETECH / TSK MHF 300 prober is an advanced probing equipment designed to analyze wafer surface defects with high-resolution imaging. It is powered by a µ-controller system with a programmable solenoid drive unit to provide precise positioning and control. TSK MHF 300 is capable of automating the entire probing process with custom programs tailored to specific requirements. The prober has two independent, high-precision horizontal stages and a vertical stage to allow for precise positioning and sample alignment. The stages can be operated with four different movements, including forward/backward, up/down, left/right and tilt. The built-in sensors detect the position of each stage and adjust the alignment accordingly. ACCRETECH MHF 300 also boasts an adjustable wortec video unit to provide digital magnification to visualize surface details and enable the user to capture images for further analysis. MHF 300 also features a highly sensitive contact sensor to detect contact and non-contact surfaces of the wafer and an automated material measurement option. The advanced controller allows for easy and flexible programming, allowing the user to create and edit custom programs with different probe sizes and depths, as well as the exact conditions needed for accurate analysis. By utilizing ACCRETECH / TSK MHF 300 with its high-precision stages, advanced controller, and flexible programming options, users can efficiently inspect wafer surface defects and analyze the results quickly and accurately. This machine is ideal for semi-conductor manufacturers looking for a reliable method of analysis and material testing. The flexible programs can be adjusted to provide customized solutions for different specifications, which increases the efficiency of production lines. Moreover, TSK MHF 300 has a compact design and is highly portable, making it ideal for field testing.