Used ACCRETECH / TSK MHF 300 #9412039 for sale

ACCRETECH / TSK MHF 300 is a high-performance prober designed for quality testing and inspection of semiconductor devices. It is capable of measuring devices with sizes ranging from 0.25 inches (6.35 mm) to 12 inches (304.8 mm). TSK MHF 300 equipment is designed with four axes of motion to provide sample probing and analysis with high accuracy. The system utilizes a motion control board utilizing real-time linear motion control and dual-axis motion control, as well as high-speed data acquisition and fast XY servo speed measurement. ACCRETECH MHF 300 unit is equipped with a vision-enabled probe station with a multi-axis control machine. It has a full color touch screen display that allows probes to be moved to any desired position. The tool has a high accuracy rate resolution of 0.1μm and comes with a 20V/30A, 300W power supply. This power supply can provide power to the probe station's DC motors, and to the laser-head. In addition, MHF 300 asset is also equipped with a 16Bit PCI A/D-D/A card and ATI graphics card with dual ADC/DAC and jumper pairs. The model can be operated with a variety of tools, such as an XY stage, XYZ stage, XYZR stage and a rotary table. These tools can be used to adjust the distance between the device under test and the probe head, as well as to adjust the angle of the probe tip. The equipment can also be equipped with an external vision system, such as a CCD camera with image processing software, in order to measure and analyze the components of the device under test. ACCRETECH / TSK MHF 300 prober is compatible with a variety of probes and test tips, such as machine-readable, spring-loaded tubular needles, probe tips, and high-performance machine-readable, spring-loaded probes. It also comes with a range of tests, such as current-voltage, power-on/off, voltage measurements, current measurements, and latency test. The unit is connected by a digital control link and a SCPI/Ethernet control that allows for remote control access. TSK MHF 300 machine is an ideal choice for testing and inspecting semiconductor devices, as it is easy to use, has a high level of accuracy and precision, and is compatible with a wide range of test and inspection tools. Due to its features and capabilities, ACCRETECH MHF 300 is suitable for use in semiconductor device manufacturing, quality assurance, and product R&D processes.