Used ACCRETECH / TSK MHF 300L #293664533 for sale

Manufacturer
ACCRETECH / TSK
Model
MHF 300L
ID: 293664533
Vintage: 2004
Manipulator 2004 vintage.
ACCRETECH / TSK MHF 300L is a prober designed for high-precision probing and testing of wafer-level products. This device was developed with the latest technologies, aimed to increase the throughput and accuracy of product testing. TSK MHF300L utilizes two independent linear axes for micromanipulations and a high-precision fine-motion equipment to allow precise positional alignment. The first axis, referred to as the "X-Axis" is designed to facilitate a speed of up to 2000 mm per second while providing a resolution of 0.1µm. This axis offers an extruded aluminum drive system, as well as CNC ballscrews and servomotors to ensure high-precision alignment and smooth motion. The second axis, referred to as the "Y-Axis" is designed to facilitate a speed of up to 1000 mm per second. This axis utilizes a high-precision cross roller guide and CNC ballscrews and servomotors to provide a resolution of 0.05µm. In addition, ACCRETECH MHF 300 L also comes equipped with a High-speed Brake Motor and a high-accuracy Fine Motion Unit This allows the device to perform precision alignment and fine movements with a resolution of 0.001µm. This machine is designed to maintain high accuracy, regardless of the operating conditions. Furthermore, MHF300L is designed with a High-speed Arm Selection tool. This asset is designed to quickly and accurately switch between different prober arms in order to reduce the need for manual changes. The prober can also be automated with its DA240 programmable controller, which is designed to provide the highest control accuracy and flexibility. ACCRETECH MHF 300L is also designed with multiple safety features. Its safety features include an E-stop lock-out model, which can be used to immediately disable the equipment if an issue arises, as well as dual-safety doors and an interlock mechanism that helps to prevent potential accidents. Overall, TSK MHF 300 L is a high-precision prober designed for use in a variety of wafer-level product testing applications. It utilizes two independent linear axes and a high-precision fine-motion system for precise positional alignment. The device is also designed with numerous safety features and automation capabilities, ensuring the highest level of accuracy and safety during product testing.
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