Used ACCRETECH / TSK MHF 300L #293664535 for sale

Manufacturer
ACCRETECH / TSK
Model
MHF 300L
ID: 293664535
Vintage: 2006
Manipulator 2006 vintage.
ACCRETECH / TSK MHF 300L is an advanced prober designed for characterization and depositing of thin-film materials. It is a high-precision instrument used for evaluating properties of semiconductor devices and substrates. The prober is equipped with a linear-drive motor system for on-the-fly patching, as well as a three-axis manipulator to access hard-to-reach locations. The prober incorporates a 300 mm wafer-test chamber, which accommodates wafers up to 300 mm in diameter. The chamber is isolated to keep thermal noise out and provides excellent vacuum stability for precise measurements. The prober also features a three-axis acceleration table that allows for high-dynamic characterization of materials. The high-resolution, force-sensing pre-tensioner in the prober ensures precise handling of delicate tools and wafers. It is designed with non-contact electrical components that allow for high-accuracy word-spinning measurements. The prober is equipped with various sensors, including temperature, pressure, and light sensors. The temperature sensor is suitable for temperature measurement with a range of -35 °C to 150 °C, and is suitable for microprocessor environments. The light sensor can detect up to four optical wavelengths, helping to analyze transparent material properties and properties. The pressure sensors detect the amount of pressure that is applied to the material, thereby allowing accurate measurement of the contact force between the tester and the sample. The prober is also compatible with a variety of testing software, including TSK MHF software, which includes a full set of functionalities to cover a wide range of characterization tasks. It also features a statistical data analysis system for automated data analysis and reporting. The data collected by the prober can be used for generating detailed reports to determine the characteristics of semiconductor materials. In summary, TSK MHF300L is a high-precision prober designed for thin-film material characterization and depositing. It is built with a wide range of features to enable faster and more accurate characterization results. The prober is equipped with various sensors and compatible with multiple testing software, making it an ideal choice for both research and commercial applications.
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