Used ACCRETECH / TSK MHF 300L #293664536 for sale

ACCRETECH / TSK MHF 300L prober is an advanced wafer probing solution designed for probing of ultra-small circuits on advanced semiconductor devices. The prober features TSK proprietary microwave frequency distribution solution that enables simultaneous testing of multiple test points. The prober also features a 12-wafer capacity, MES multi-level heat exchanger and a step-and-repeat sampling equipment. Additionally, the prober boasts a five-axis automated motion system designed to reduce probing time while providing precise control of movements and accurate probing of small structures. TSK MHF300L prober is capable of meeting industry standards, is compliant with USP Class III requirements, and is electrically compliant with SEMI E98. The prober also features an optional sample length and type detector and an optional auto-calibration module. ACCRETECH MHF 300 L prober is also designed with a user-friendly graphical user interface with the ability to store and analyze up to three years of test data. MHF300L prober offers a wide range of test options including gate array, analog, digital, high density, low density, and buried channel. These technologies are accomplished with ACCRETECH channel interleaving capability, coupled with its high accuracy conventional and microwave probing configuration. The probe card has several unique features that enhance the performance and reliability of the prober. These include several different types of guard rings, a crosstalk elimination unit, and an inductance matched differential amplifier for optimum signal integrity. Additionally, the unique features of ACCRETECH / TSK MHF300L prober enable efficient high frequency probing and enable probing of multiple adjacent elements with minimal crosstalk. The prober is preloaded with numerous parameters to ensure that tests are completed accurately and in a timely manner. ACCRETECH MHF300L prober also features low-noise amplifiers, an fault intercept machine for diagnostics, and an array interface function for data stream testing. In short, TSK MHF 300 L prober is a state-of-the-art wafer probing solution that offers fast, accurate and reliable testing for advanced semiconductor devices. With its wide range of test options, high accuracy, user-friendly interface, and advanced features, MHF 300 L prober is designed to meet the demanding needs of modern semiconductor production and test.