Used ACCRETECH / TSK MHF 300S #9036027 for sale

ACCRETECH / TSK MHF 300S is a prober designed for precise, high-accuracy probing for wafer-level testing. This prober is capable of controlling the temperature of wafers or test boards up to 300°C and offers automated operation for superior performance and functionality. The equipment is integrated with a powerful control system that automatically adjusts the pressure and displacement, and regulates the measuring force. This ensures accuracy and consistency in the measurements while eliminating the need for frequent manual adjustment. The unit also incorporates a highly accurate laser interferometer measuring machine for superior alignment and accuracy. TSK MHF 300S is capable of controlling the X-Y flatness and rotation of wafers or test boards, as well as controlling the pressure, displacement, and other parameters of the prober. It can be used to measure multiple points on the same wafer or test board with very high accuracy. The optional MicroWedgeTM software allows for fast contour mapping in the wafer or test board plane. ACCRETECH MHF 300S also incorporates a high-quality, high-resolution microscope tool. This asset allows for enhanced visibility of the wafers or test boards, enabling highly accurate real-time inspections. The user can view the results with the microscope both before and after probing. The model has a 3D-alignment mechanism which ensures accurate wafer and test board alignment. It can be used to measure multiple points on the same wafer or test board with very high accuracy. The equipment also features built-in Metrology software that helps the user calibrate the system and verify the results. MHF 300S is designed to be compatible with a variety of wafer and test boards, including 3D wafer probing and thin die probing. Its versatile design and easy integration make it an ideal prober for various applications. In summary, ACCRETECH / TSK MHF 300S is a powerful prober suited for applications requiring precise, high-accuracy probing. It features a powerful control unit, a laser interferometer measuring machine, a high-quality, high-resolution microscope tool, and a versatile 3D alignment mechanism. The user can also take advantage of the optional MicroWedgeTM software and built-in Metrology software for accurate and reliable results. This prober is ideal for various wafer and test board probing applications.