Used ACCRETECH / TSK MHF 300S #9218068 for sale

ACCRETECH / TSK MHF 300S is a prober used primarily for in-plane probing applications such as micro- via, micro bonding, wafer characterization and test probing. It features high throughput, accuracy and precision required by today's most challenging wafer analysis and test requirements. It is an optically based, automatic, variable angle, four or six axes prober with manual or auto light source rotation. The variable angle probe head serves as an optical line of sight while the auto-light source rotation allows it to adjust to complex patterns or varying angles. The XY,Z motion stage equipment employs a closed loop servo motor drive with a resolution of 10 μm. This allows for precise positioning and repeatability. The prober also offers a drop-on style probing configuration which allows for quick and easy changeover between the prober and various probe cards without the need for any re-calibration. TheMHF 300S includes a full suite of high accuracy force measurement functions as well as advanced vision systems. The force measurement system employs high-resolution linear force sensors with a resolution of 10 nN. The vision unit offers high-resolution imaging up to five megapixels with selectable automation performance optimization. With a hybrid platform combining both optical and force measurements, the prober can execute complex test protocols and quickly identify failures in components and design features. The prober is designed to fit into the modern electronics test environment, featuring easy setup and operation which can be fully automated on a PLC automation machine. This makes the prober an ideal solution for efficient and accurate production testing. All these features come together to make TSK MHF 300S an invaluable tool for carrying out in-plane probing, testing and characterization.