Used ACCRETECH / TSK MHF 400 #9021633 for sale

ACCRETECH / TSK MHF 400 is a wafer prober that is designed for automated wafer probing of discrete components and logic devices. The prober is capable of performing high accuracy, high resolution testing on wafers of 125mm, 200mm, and 300mm diameters, with probing of microscopic points down to 2.5µm. The prober is equipped with an advanced six-axis (X, Y, R, Z, T, Q) motion control equipment which allows for precise and repeatable test placement. An optional three-axis board prober system is also available for testing of three-dimensional structures such as QFP packages. TSK MHF 400 comes with a variety of software options for managing, analyzing, and controlling the test process, including interfacing to wafer maps, image recognition, and vectorizing. Multiple probes can be used simultaneously for increased accuracy and speed of probing. The unit also features a multi-interface equirty machine (MIFES) which allows multiple probe cards to be easily connected and swapped in order to test a variety of different device types. ACCRETECH MHF400 is equipped with a robust, user-friendly design that features software remote control capability for easy integration into automated robotic testing systems. Careful attention to optimizing the overall tool performance has resulted in shorter prober cycle times, consistent repeatability, and superior yield. Use of the prober in an automated environment also ensures superior product quality for a wide variety of different devices. In addition to its testing capabilities, MHF400 is also compatible with multiple accessory tools, providing an efficient and reliable platform that meets the most challenging test applications. Contemplated accessories include an automatic focus module, a programmable die transfer tool, a sample and part transfer tool asset, and a variety of other automated assembly and testing tools. Overall, ACCRETECH / TSK MHF400 is an ideal solution for testing discrete components and logic devices, providing excellent resolution, fast cycle times, and robust automation tools. The compatibility with a range of accessories allows the prober to be customized for numerous test applications, ensuring reliable, high-yield results.