Used ACCRETECH / TSK MHF 400 #9030481 for sale

ACCRETECH / TSK MHF 400 is an advanced prober designed to offer high precision and accuracy for measuring semiconductor wafers and near-to-wafer components. The tool is equipped with 4 blade blades that are capable of reaching a maximum depth of 5 µm, enabling researchers and engineers to accurately measure the thickness and contour of any flat wafers, as well as any irregularities that appear near the wafer surface. TSK MHF 400 is capable of handling a wide range of wafer formats, including up to 50 mm thick, 8 inches in diameter, and up to 8" wafers with a variable pitch of 80 µm. The prober is compatible with various wafer sorting systems, including vacuum lifting, o-ring, or nozzle pick-up systems. ACCRETECH MHF400 is equipped with a host of features, including a digital display for showing a graphical representation of the blade position, temperature alarm monitor, and a vacuum gauge for ensuring optimal sample positioning for accurate and precise measurements. It also has a low-noise and vibration-free design, which is ideal for testing wafers in a micro-environment. Other features of ACCRETECH MHF 400 include an automated operation and an integrated design of the prober and wafer for easy maintenance. It is capable of reaching temperatures of 100°C in 10 minutes, ensuring that wafers are optimally heated for measuring. The tool also features a high speed probing rate of up to 10 Hz and offers through-wafer detection for any irregularities that may be present within a wafer. MHF 400 is a versatile and powerful prober, designed to provide researchers and engineers with accurate and reliable measurements within a compact size. The tool is capable of accurately measuring wafers with a precise depth detection, as well as offering high-speed probing and an automated operation through its integrated design. With its multi-function capabilities, ACCRETECH / TSK MHF400 provides a comprehensive and reliable solution for measuring wafers and near-to-wafer components.