Used ACCRETECH / TSK MHF 400 #9194866 for sale

ACCRETECH / TSK MHF 400 is a prober designed for thin film analysis in the semiconductor and electronics industry, used to inspect a variety of features on the surface of various wafers, including resistivity, capacitance, optical, micro defects, thin film measurements, and dielectric constant measurements. The prober uses a highly advanced system capable of directly measuring samples without the need for any intermediate steps such as handling or cleaning. The prober has a 6 inch wafer capacity and is capable of quickly and accurately measuring different elements on the surface of a wafer in minutes. Its high-sensitivity feedback system further ensures high accuracy in the surface analysis. The prober is also equipped with a sophisticated yet user-friendly graphical user interface (GUI). This allows operators to easily manipulate a wide range of parameters and display the results of their measurements. The GUI also has many features that enable users to monitor various functions, such as the status of the power supply, wafer testing status, and temperature of the prober environment. In addition to its high-resolution monitoring and feedback capabilities, the prober also provides a variety of operational features including: optical zoom, on-board metrology, electrical test, and micro-Raman measurements. The optical zoom feature allows operators to zoom in on the wafer to examine the details of its features with extreme accuracy. On-board metrology utilizes the prober's built-in system to take precise, repeatable measurements of a variety of features on the wafer. These measurements can then be used to ensure compliance with applicable industry standards. The electrical test feature of TSK MHF 400 provides an advanced solution to test the resistance and capacitance of the wafer. It also features a sensitive surface material scanning algorithm, which enables operators to observe the properties of the wafer in real time. The micro-Raman feature enables users to examine the physical properties of a wafer's surface at the microscopic level, which is essential for analyzing difficult to inspect areas. Due to its sophisticated design and advanced features, ACCRETECH MHF400 prober is an ideal choice for a broad variety of demanding applications. Its intuitive design allows even inexperienced operators to make the most of the prober's capabilities, allowing them to quickly and accurately measure the properties of wafers with ease.