Used ACCRETECH / TSK MHF 4000 #9035725 for sale

ACCRETECH / TSK MHF 4000 is a prober designed for testing and probing of devices such as integrated circuits, microprocessors, memory chips, and other discrete electronic components. This equipment offers a high degree of accuracy and stability through a combination of Wafer Automatic Probing (WAP) and needle fine-probing technologies. TSK MHF 4000 is capable of probing at a variety of pitches and sizes including 0.5mm, 0.25mm, 0.125mm, and 0.08mm. WAP technology provides for high-precision alignment of needles with underlying components on the wafer, enabling the system to locate and map out even the finest of structures. Additionally, ACCRETECH MHF 4000 features a unique needle fine-probing technology that allows for an incredibly high level of accuracy and precision. This technology utilizes a combination of optical and mechanical systems to precisely locate and probe components at incredibly small distances. MHF 4000 is outfitted with a comprehensive suite of software and hardware features that enable it to accomplish a wide variety of testing and probing functions. Its improved computing power, along with intuitive graphical user interface (GUI), allows operators to configure and monitor the unit quickly and easily. This prober is further equipped with an open architecture platform that allows for it to be easily integrated into existing production lines and test cells. In order to ensure accuracy and reliability in testing, ACCRETECH / TSK MHF 4000 comes with various probing functions, including interference waveform measurement, waveform comparison, power failure measurement, and atomic force microscopy. These features enable the machine to accurately evaluate and diagnose device performance, ensuring superior results. Additionally, TSK MHF 4000 includes a comprehensive monitoring tool, designed to detect misalignments, needle jams, and other potential problems. By ensuring the prober is always functioning properly, ACCRETECH MHF 4000 is able to maximize accuracy with its testing and probing operations. MHF 4000 is an advanced prober designed for testing and probing of fine-pitched component structures. Through its combination of Wafer Automatic Probing (WAP) and needle fine-probing technologies, this asset offers superior accuracy and stability. Additionally, ACCRETECH / TSK MHF 4000 is outfitted with a comprehensive suite of software and hardware features that enables it to accurately evaluate and diagnose device performance. It is also equipped with a comprehensive monitoring model to detect potential misalignments and needle jams, further maximizing its accuracy and reliability in testing.