Used ACCRETECH / TSK MHF 410 #293608350 for sale

ACCRETECH / TSK MHF 410 is a prober developed to provide quick, accurate and reliable data when testing semiconductor devices. The prober is a sophisticated testing tool that is designed to save time and improve accuracy. It combines a sophisticated design with a straightforward operation, providing a cost-effective solution to a complex testing problem. The prober utilizes a four-axis motion control system to accurately position test structures, while a three-axes force detection device is used to detect the forces that are required to perform a reliable friction force test. This makes TSK MHF 410 ideal for both regular and irregular device shapes. The utilization of force detection during testing allows for rapid and accurate data collection, significantly reducing testing time and improving yield. The prober also features an automated collision recovery feature. This detects any accidental collisions and adjusts its motion speed to ensure that no further damage is caused. This not only reduces downtime and damage costs, but also eliminates the need for manual intervention during process handling to fix any mistakes. Additionally, the prober is self-calibrating, meaning that it can accurately perform testing operations even after thousands of tests. The prober can also handle a wide range of wafer sizes, from 12 to 200 millimeters, making it an ideal solution for a variety of testing scenarios. It also features a high-resolution camera system that captures low-contrast targets, allowing for faster and more accurate measurements. After testing, collected data is automatically stored on external devices such as USB drives, for faster analysis and improved yield. Overall, ACCRETECH MHF 410 is a versatile prober that delivers accurate and reliable data for semiconductor testing. The utilization of advanced features such as force detection and collision recovery allows for faster and accurate measurements and data collection, providing a cost-effective solution to complex testing problems.