Used ACCRETECH / TSK MHF 410 #293653275 for sale

ACCRETECH / TSK MHF 410 is a high precision surface prober designed for the semiconductor industry. It utilizes high resolution optical interferometry to measure small changes in surface features with extreme accuracy. It can be used to measure parameters such as protrusions, planarity, line width, surface finish and scratch depth. This prober features a flat stage is located on a stable, vibration-free mechanical base. It is capable of precise X-Y-Theta stage movements, and the high-resolution encoders ensure precise and accurate alignment. The prober also comes equipped with a navigation system that assists in locating the exact position of the sample. TSK MHF 410 utilizes AC-coupled l and HeNe lasers to measure small changes in the height profiles of microscopic surface topologies. It is capable of displaying multi-angular measurement data points with high precision and accuracy, and can display angular data for individual measurements for critical analysis of surface topologies. The prober also measures the rotational alignment of the object using a dual-axis tilt mechanism. This ensures precise and accurate rotation measurement ensuring travel while maintaining the same vector on the surface. Additionally, the prober features a variety of analysis functions, including an area detection algorithm, guard detection and a line edge detection system. ACCRETECH MHF 410 is an ideal choice for evaluating semiconductor devices, integrated circuits, and other micro components. It is capable of measuring features over a wide range of sizes (0.001 - 10000 μm). The data provided is highly accurate and is displayed in real-time on a built-in GUI. It is also capable of exporting the data in either text or Excel format. Easy to use and highly user-friendly, MHF 410 is an excellent choice for probing and measuring micro components. With its advanced optics and accurate measurement capabilities, this prober is an indispensable tool for any semiconductor laboratory.