Used ACCRETECH / TSK SA-2500 #9270843 for sale

ACCRETECH / TSK SA-2500
Manufacturer
ACCRETECH / TSK
Model
SA-2500
ID: 9270843
Prober.
ACCRETECH / TSK SA-2500 is a prober designed for 3D IC testing and analysis. It is an efficient and high-precision testing tool, able to provide comprehensive surface analysis for a variety of applications, including those related to semiconductor microstructures. TSK SA-2500 has a flexible, highly sensitive design. It features a variety of capabilities, including advanced 3D imaging, electrical characterisation, and dynamic data acquisition. It has been designed to provide repeatable results with a high degree of accuracy. ACCRETECH SA-2500 features a robust, reliable dual-channel architecture that allows it to perform testing from both sides of the device. Three axes of motion for sample transport enable it to quickly sample large numbers of devices in a single test session. SA-2500 has a powerful, sophisticated control equipment to facilitate testing and analysis. The control system is designed to be user-friendly, with an intuitive graphical user interface that allows users to quickly set up, program, and execute tests. The unit also allows for customised testing profiles to be developed and easily shared across multiple users. For image analysis, ACCRETECH / TSK SA-2500 features advanced optical and CCD imaging systems that are capable of detecting a wide range of features. The machine is able to produce high-resolution images with a magnification of up to 500x. The tool also includes a variety of advanced processing options, such as focus stacking, color map analysis, pattern recognition, and feature measurement. The ability to precisely measure and analyse a wide variety of features is further enhanced by TSK SA-2500's advanced metrology asset. Featuring a high-speed scan rate of up to 10 mm/sec and a flexible range of probe tips, the model allows for a variety of measurements to be obtained on a single device. Furthermore, the equipment has the capability to record and analyse dynamic data, including temperature, thermal transition speed, and output power levels. Overall, ACCRETECH SA-2500 is an advanced prober designed for 3D IC testing and surface analysis. It provides an efficient and precise instrument for testing a variety of semiconductor microstructures. By combining advanced imaging systems, metrology, and dynamic data acquisition capabilities, SA-2500 is an invaluable tool for researching and analyzing a wide range of microelectronic devices.
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