Used ACCRETECH / TSK UF 190 #293645099 for sale

ACCRETECH / TSK UF 190 prober is an advanced testing equipment designed for applications in a variety of industries. It provides fast, accurate measurements of electrical connections, contact continuity, and other parameters. The advanced technology of this system allows for testing of advanced wafer devices in a repeatable, reliable manner. TSK UF 190 prober contains a desktop automated prober unit and an integrated PC software, which are combined with advanced software artificial intelligence to provide powerful machine capabilities. This tool is also equipped with a sample robot, a probe card/loader, and a device interface to provide complete test coverage. Furthermore, the asset also features a multi-functional membrane keypad which provides a convenient platform for model setup, including control of the operation, data input/display and equipment alarms. ACCRETECH UF 190 prober offers several features that enable it to meet the specific requirements of different industries. It is equipped with multiple layout and probe positions, allowing for the detection of small-sized wafers with a high degree of accuracy. The system also features an auto loading/unloading unit which automatically loads and unloads wafers onto the prober. Additionally, it has a multi-angle vision measurement machine for precise alignment of wafers. Moreover, UF 190 prober has a built-in defect review tool, which provides a comprehensive analysis of test results. This asset also has several advanced software functions such as Noisy Flat Pattern Correction, Pin Switching, High Precision Paddle Test and Advanced Status Monitoring. Finally, this model is designed for easy maintenance, with filters to prevent contamination and optional software for equipment configuration, communication with external equipment and the creation of reports for post-test comparison. In conclusion, ACCRETECH / TSK UF 190 prober is a highly advanced testing system designed for a wide range of industries. It has several advanced features such as a sample robot, auto loading/unloading unit and a built-in defect review machine. This tool also offers an easy-to-use membrane keypad and software for asset setup, data input/display and model alarms. Moreover, it is designed for easy maintenance, with filters to prevent contamination and optional software for equipment configuration. Finally, TSK UF 190 prober provides fast, accurate measurements for wafer devices of all sizes.