Used ACCRETECH / TSK UF 190 #9066941 for sale

ACCRETECH / TSK UF 190 is a wafer prober for use in semiconductor testing laboratories. It is a fully automated prober that has been designed to quickly and efficiently probe all types of semiconductor devices. This prober is equipped with both vertical and lateral probe arms, allowing it to access parts on both a horizontal and vertical plane. Additionally, the prober offers user-friendly touchscreen programming, multiple loading options to speed up wafer handling, and low noise emissions. TSK UF 190's embedded probe tip features a 3-axis design that maximizes uniformity and accuracy, giving users the ability to precisely probe all types of semiconductor devices. Additionally, the prober incorporates Ejector systems that enable users to quickly remove devices from the prober without damaging them. This allows for precise placement and testing of devices that would otherwise be difficult or time consuming. The prober is also equipped with a state-of-the-art high-resolution optics subsystem, allowing for precise probing and testing of high-density devices. With the help of this optics subsystem, the prober can accurately capture data points in all dimensions, providing invaluable feedback for quality control. ACCRETECH UF 190 also features a robust wafer mapping capabilities. This feature allows users to create a "prioritized" program sequence so they can quickly and efficiently prioritize their testing procedures and adjust the testing process as needed. To further add to its portability, the prober also offers an optional built-in memory that can store up to 200 entries, making the process much simpler and ensuring that important data is always accessible. In conclusion, UF 190 is a robust and reliable wafer prober for use in semiconductor testing laboratories. With its user friendly touchscreen programming, multiple loading options, low noise emissions, and high-resolution optics subsystem it is a powerful tool for quickly and accurately probing semiconductor devices. Additionally, the prober's wafer mapping capabilities, and optional built-in memory make it a must-have for any modern testing laboratory.