Used ACCRETECH / TSK UF 190A #9091012 for sale

ACCRETECH / TSK UF 190A prober is a fully automated, high-performance wafer probing system. It is designed to perform electrical and physical tests such as high-accuracy probing, wafer post-exposure inspection, and electrical characterization of devices. TSK UF 190A prober delivers accurate and reliable test results for circuit validation. It is equipped with various advanced technologies such as high-precision non-contact automatic alignment, wafer-level parametric testing, and beam scanning technologies, which allow it to provide efficient wafer probing. The prober features a multi-core portfolio of automatic probing heads, sensors, and remote wafer-handling units, allowing users to customize the system for applications such as device characterization and production testing. Additionally, it offers a variety of probe cards, test fixtures, and other peripherals to support any application. Multiple probe-card decks are offered in configurations of up to four cards. The probe-card accessories on ACCRETECH UF 190 A prober include a movable tip calibration block, a non-contact parallax monitor, and laser probes, enabling the prober to provide high-accuracy alignment and wafer probing. To further enhance accuracy and productivity, the prober can be integrated with a variety of wafer back-end modules such as die-sorting and burn-in modules. ACCRETECH / TSK UF 190 A prober also offers a suite of software tools to configure, control, and monitor the probing process. It features powerful test and alignment algorithms such as fuzzy logic and Prober Control for guiding the arm and controlling the probes. All of these tools work in tandem to provide smooth and accurate wafer probing, resulting in consistent results. ACCRETECH UF 190A prober is an ideal solution for production testing and characterizing semiconductor components. With its advanced features and capabilities, it provides efficient and reliable probing for a wide range of applications.