Used ACCRETECH / TSK UF 190A #9222900 for sale

ACCRETECH / TSK UF 190A is a cost-effective, highly reliable prober built for advanced semiconductor testing. This prober offers superior performance and precision that can help speed up testing cycles. It is one of the most efficient probers and is designed with a modular architecture that allows users to customize the probes and improve the accuracy and efficiency of the testing. TSK UF 190A features a 3-axis positioner that provides a wide range of motion and allows the prober to move across a W-die set at high speeds. It also offers a high controlling speed of up to 0.5mm/s and an accuracy of ± 0.01mm. This provides accurate and repeatable results for reliable testing. The prober is equipped with a universal chuck that can support up to 8-inch wafers or 3-inch W-diesets. For further precision, ACCRETECH UF 190 A comes with a camera system for accurate positioning and alignment of the chips. In addition, UF 190 A comes with a FOUP/FOSB tray handler that enables quick product loading and unloading. The FOUP/FOSB tray handler has an innovative self-adjustable mechanism, which ensures that the wafer is properly gripped for reliable and safe handling. It is also built with a safe-guard system that prevents improper operation by detecting and alerting the user if errors are spotted in its operation. UF 190A has a wide range of additional features that ensure that the users get superior performance. It is designed with a precision automatic leveling system that reduces vibration and improves accuracy while testing. Additionally, TSK UF 190 A has a modular architecture and a multitude of options that allow users to select and interchange the probes and accessories for their specific requirements. Overall, ACCRETECH / TSK UF 190 A is a cost-effective, efficient, and reliable prober ideal for high-precision testing and characterization. Its modular architecture and multiple optimization options help to improve the accuracy, speed and efficiency of the testing, which can reduce test time significantly.