Used ACCRETECH / TSK UF 190B #293614769 for sale

ACCRETECH / TSK UF 190B is a prober designed for electrical testing and probing of wafer structures. It is capable of testing both thin film and thick film substrates. The prober features a precision probe arm, a user-friendly interface and powerful software components. It is well-suited for applications such as measurement and control of parameters such as probe force, temperature and stress. The prober has an advanced scanning system for reliable alignment and imaging of wafers for testing. It is equipped with a three-stage variable DC power supply capable of providing up to 190 volts for wafer measurement. The contact force of the prober's probe arm can be adjusted to ensure accurate testing. The arm can provide consistent dip contact-force in order to ensure accurate testing. The prober is equipped with a high-resolution color LCD display, a graphical user interface and keypad. The LCD display provides the user with visual feedback on the current status of the probe arm and current settings. The graphical user interface allows users to create testing patterns, define settings and execute commands. The keypad makes input of commands and data easier and faster. TSK UF190B also features powerful software components that enable users to easily control and adjust the prober's settings. These features include on-screen probe force adjuster, automated sensing and compensation of ambient temperature, probe force Mapping, data logging and user-defined trigger modes. ACCRETECH UF 190 B is ideal for applications from basic to complex testing and probing of wafer structures. It is reliable, easy to use and provides excellent accuracy for wafer measurements. The prober is durable and a great choice for any experimental or production environment.