Used ACCRETECH / TSK UF 190B #293614770 for sale

ACCRETECH / TSK UF 190B is a prober designed to meet a wide range of challenging semiconductor testing and metrology needs. TSK UF190B has a robust, modular design with a large working area ability and high throughput for a wide variety of wafers, packages, and substrates. The high speed, large probing area, and hot chuck capability of ACCRETECH UF 190 B provide an ideal solution for testing, probing, and characterizing semiconductor devices. TSK UF 190B's modular design enables simultaneous testing of multiple sites of varying sizes. With its 99 independent test channels, it can accommodate a variety of standard and custom probes. Its built-in variable auto-focus capability provides greater accuracy and precision by automatically adjusting the probe tip to the wafer surface height. This versatile prober features a high-speed capability with a maximum probe speed of 120mm/sec, as well as high accuracy and repeatability thanks to its dual motor non-contact z-axis drive. This ensures that probes consistently deliver reliable results. The prober also has excellent linearity accuracy, standoff voltage and contact force sensing, and digital signal processing capabilities. UF 190B prober is also equipped with an integrated test cell management equipment. This allows users to implement sophisticated test circuit and probe layouts quickly and easily. The prober also includes a Probe Library Manager, which allows users to create, store, and recall probe tunes quickly and easily according to specific test requirements. UF 190 B prober also offers a variety of additional features to maximize efficiency. It can interface with multiple SECS/GEM host systems for process control and monitoring, as well as monitor and control probe driver current, voltage, and pressure. Additionally, the system is also equipped with Job Docs, which allows users to create, store, and recall full test job information Overall, ACCRETECH UF 190B prober is a reliable and accurate prober designed for a variety of test applications. Its modular design, integrated test cell management unit, and Probe Library Manager are all key features that makes this a highly efficient and effective machine for any semiconductor and metrology testing requirement.