Used ACCRETECH / TSK UF 190R #293597956 for sale
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ID: 293597956
Wafer Size: 8"
Vintage: 2016
Probers, 8"
No hot chuck
No OCR
2016 vintage.
ACCRETECH / TSK UF 190R is a prober specifically designed to handle complex semiconductor testing situations that require advanced probing technology. It is the most versatile and advanced prober of its type and enables users to use a variety of probing styles, positioning configurations, and probing devices. It has an automated equipment to ensure consistent and reliable probing of even the most challenging devices. TSK UF 190R has a modular design approach, which allows for the inclusion of many different types of probers. The most common types are wafer probers, laser probers, and flip-chip probers. Wafer probers are used to test and inspect wafers and devices at their die-level testing sites. Laser probers use a computer-controlled system to align and move the probe tips, while also allowing for the use of various types of probes. Lastly, flip-chip probers are used to test both wafer and chip-level devices. ACCRETECH UF 190R has two main modules - the prober and the test platform. The prober module is designed to handle a variety of different test requirements with its durable construction, and has an adjustable head that makes fine adjustments to the position of the probe tips. The test platform module is made up of a high-end CPU, large memory and multiple high-speed data channels to ensure accurate testing of complex devices. UF 190R also has a unique laser mark detection feature and a video magnification unit for inspecting devices at high resolution. The laser mark detection feature is used for inspecting the surface of the device and ensuring the probe tip is precisely within the die area of the device. The video magnification machine allows for the use of a camera to inspect each individual die, providing the highest accuracy and resolution possible. ACCRETECH / TSK UF 190R includes many features that enable higher throughput and accuracy for inspection of devices. For example, the prober module can be equipped with a variety of probes, including pneumatic, capacitive, and roll-over types, to ensure optimal performance. It can also be equipped with a variety of accessories to enable easy maneuvering of the prober and reduce downtime during testing. By combining multiple modules into a single platform, TSK UF 190R is the most advanced and versatile prober available. Its modular design offers users the capacity to handle even the most complex testing requirements, while its advanced features help to ensure consistent accuracy and reliability in their results. It is the perfect solution for any semiconductor testing situation that requires precision and accuracy.
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