Used ACCRETECH / TSK UF 200 #293597888 for sale

ACCRETECH / TSK UF 200 is a prober designed for wafer probing and testing of ultra-fine pitch semiconductors and MEMS. It is capable of testing small packages and large-sized substrates with a variety of probe processes and test methods. Its versatile design and high-speed operation make it an ideal solution for any technical application. TSK UF 200 offers a wide range of features to meet the needs of those who require high accuracy and precision. It utilizes an xyz-style probe head with low contact force, and a minimum of piezo actuators to achieve responsive, repeatable and reliable probing without any vibration. Its accuracy and repeatability is further enhanced by its auto-focus sensors and limited tolerances of 0.004" and 0.001", respectively. ACCRETECH UF200 also features top and bottom side probing for two-sided devices, as well as flip-chip devices. It is equipped with a 2-axis rotating chuck for efficient probing of large substrates and tapered devices, and the ability to make datastation changes without manual intervention. ACCRETECH / TSK UF200 is designed to work with a variety of test methodology programs (Valve+, DAX and Benchmark Prober technology) as well as with on-board test tools and tools that are provided by test equipment vendors. Its high-speed movement is programmable, and can be tailored to fit specific testing requirements. Additionally, its ultra-fine resolution measurement system avoids limit switches to provide accurate and reliable measurements. Additional features of ACCRETECH UF 200 include independent PFA aligners, 1-axis chipmaker functions, multi-prober support, automated offset capability, small footprint, high-power pulse current, probe force compensation and compensation, quick-lock style platen, precise wafer alignment, easy-access panel and backlight, and an adjustable wafer holder. TSK UF200 also features an advanced environment management unit for machine monitoring, safety and maintenance. Overall, UF200 is an ideal solution for all probing and test requirements, from small, precise applications to large-scale, intensive needs. Its versatile design and low contact force, combined with its high-speed operation, make it a reliable, repeatable and precise solution for a variety of semiconductor and MEMS testing tasks.