Used ACCRETECH / TSK UF 200 #293615530 for sale

ACCRETECH / TSK UF 200 is a prober, designed to do surface non-destructive electrical testing. It is designed to quickly and accurately measure the electrical properties of semiconductor materials and devices to identify problems. The prober is specifically designed to support the testing needs of thin wafers and ultra-fine pitch devices. The prober features a dielectric force microscope (DFM) that can accurately measure the quasi-static dielectric properties of the semiconductor materials at low and high frequencies. It also includes an actuated force temperature controller (AFTC) to maintain temperature stability during the measurement and testing process. The combination of the DFM and AFTC make it possible to accurately measure the electrical properties of semiconductor materials and devices regardless of temperature fluctuations. The prober has a high-resolution optical microscope and a digital video processor that allows the user to observe the microscopic features of the wafer and devices being probed. The device also features an advanced control software package that provides the user with intuitive control on all device parameters including test angle and force for optimal signal capture. The prober also includes an automated self-centering unit calibration (SUC) system that can be used to precisely align and center the probers tip to the sample edge. This ensures that misalignment and inaccurate probing do not occur. The prober also includes several safety features that allow the user to remain safe while conducting the tests. These include vibration and acoustic signaling, visual indication, and an audible alarm for when an unsafe condition occurs. TSK UF 200 prober provides reliable, repeatable, and accurate testing results. It is an ideal solution for wafer testing, architectural testing, detecting open and short defects, analyzing wire bonding, device characterization and CAD designs, and measuring quasi-static dielectric properties of semiconductor materials.