Used ACCRETECH / TSK UF 200 #293617575 for sale
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ID: 293617575
Vintage: 2000
Automatic wafer prober
Chuck top
Z-Unit
X-Axis screw / X-Motor
Y-Axis screw / Y-Motor
F-Axis screw
E1 Camera module
E2 Camera module
Joystick
Touch panel / keyboard
Alarm lamp pole
Docking: Hinge
TEMPTRONIC Chiller
Relay board
Power control board
Loader 5-axis board
Stopper
Loader
VME Rack:
Slot 1: Master CPU
Slot 4: VGA Card
Slot 6: COGNEX Board
Slot 8: PIO Board
Slot 10: GPIB Board
Slot 11: (5) CH PGEN Boards
Slot 14: Disp sensor
Slot 16: Slave CPU
Slot 17: Loader I/O
Slot 18: Loader PGEN
Floppy disk
Hard Disk Drive (HDD)
Read side:
Driver board
Moire divider board
Loader side:
Loader driver board
Loader sensor board
Cassette cover
Elevator motor driver
Sub-chuck rotation motor driver
Turntable motor driver
(2) Transfer motor driver arms
Sub-chuck
Pre-alignment sensor
(2) Arms
Inspection tray
Temperature controller
Elevator / clamper
Control rack:
Z-Axis driver
X Servo driver
Y Servo driver
Missing parts:
MO Disk
Keyboard control board
Chiller
Power supply: (2) 24 V, +12 V, -12 V, 5 V, +48 V
2000 vintage.
ACCRETECH / TSK UF 200 Prober is an automated probing and test equipment specifically designed for production testing. It provides a comprehensive feature set with full programmability and flexibility to handle a wide variety of devices, such as FETs, ceramic substrates, integrated circuits, and hybrid wafers. The system is based on a modular and expandable infeed and outfeed (IOF) unit and features a compact design which allows it to fit within the working space of most production lines. It is further equipped with an intuitive, graphical user interface and optimization software which provides self-learning functions, automated tool selection, and data analysis in order to maximize the testing efficiency. TSK UF 200 Prober is capable of operating at a speed of up to 200 wafers per hour, and integrating up to seven different contact probes at one time. The machine is equipped with a high-resolution camera, which enables it to accurately position each wafer by zooming to the specified coordinates. Additionally, the tool offers a multi-point measurement feature for precision measurements. This feature allows for the simultaneous measurement of up to 64 different points on the same substrate, ensuring a highly accurate result. The prober also includes a computer-based probe program editor, which allows users to easily create and modify test programs with a high degree of flexibility. This feature allows users to further customize their settings and enables them to create complex test programs, such as combinatorial probing or extended scanning. Moreover, the asset is equipped with a statistical process control suite that monitors, records, and reports on wafer defect and yield characteristics in parallel with the production process. These features, combined with ACCRETECH UF200's robust construction and highly intuitive software, make it an ideal all-in-one production model for quality, cost and yield management for volume production applications.
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