Used ACCRETECH / TSK UF 200 #293617575 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 200
ID: 293617575
Vintage: 2000
Automatic wafer prober Chuck top Z-Unit X-Axis screw / X-Motor Y-Axis screw / Y-Motor F-Axis screw E1 Camera module E2 Camera module Joystick Touch panel / keyboard Alarm lamp pole Docking: Hinge TEMPTRONIC Chiller Relay board Power control board Loader 5-axis board Stopper Loader VME Rack: Slot 1: Master CPU Slot 4: VGA Card Slot 6: COGNEX Board Slot 8: PIO Board Slot 10: GPIB Board Slot 11: (5) CH PGEN Boards Slot 14: Disp sensor Slot 16: Slave CPU Slot 17: Loader I/O Slot 18: Loader PGEN Floppy disk Hard Disk Drive (HDD) Read side: Driver board Moire divider board Loader side: Loader driver board Loader sensor board Cassette cover Elevator motor driver Sub-chuck rotation motor driver Turntable motor driver (2) Transfer motor driver arms Sub-chuck Pre-alignment sensor (2) Arms Inspection tray Temperature controller Elevator / clamper Control rack: Z-Axis driver X Servo driver Y Servo driver Missing parts: MO Disk Keyboard control board Chiller Power supply: (2) 24 V, +12 V, -12 V, 5 V, +48 V 2000 vintage.
ACCRETECH / TSK UF 200 Prober is an automated probing and test equipment specifically designed for production testing. It provides a comprehensive feature set with full programmability and flexibility to handle a wide variety of devices, such as FETs, ceramic substrates, integrated circuits, and hybrid wafers. The system is based on a modular and expandable infeed and outfeed (IOF) unit and features a compact design which allows it to fit within the working space of most production lines. It is further equipped with an intuitive, graphical user interface and optimization software which provides self-learning functions, automated tool selection, and data analysis in order to maximize the testing efficiency. TSK UF 200 Prober is capable of operating at a speed of up to 200 wafers per hour, and integrating up to seven different contact probes at one time. The machine is equipped with a high-resolution camera, which enables it to accurately position each wafer by zooming to the specified coordinates. Additionally, the tool offers a multi-point measurement feature for precision measurements. This feature allows for the simultaneous measurement of up to 64 different points on the same substrate, ensuring a highly accurate result. The prober also includes a computer-based probe program editor, which allows users to easily create and modify test programs with a high degree of flexibility. This feature allows users to further customize their settings and enables them to create complex test programs, such as combinatorial probing or extended scanning. Moreover, the asset is equipped with a statistical process control suite that monitors, records, and reports on wafer defect and yield characteristics in parallel with the production process. These features, combined with ACCRETECH UF200's robust construction and highly intuitive software, make it an ideal all-in-one production model for quality, cost and yield management for volume production applications.
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