Used ACCRETECH / TSK UF 200 #293617577 for sale
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ID: 293617577
Vintage: 2000
Automatic wafer prober
Chuck top
Z-Unit
X-Axis screw / X-Motor
Y-Axis screw / Y-Motor
F-Axis screw
E1 Camera module
Joystick
Touch panel / Keyboard
Alarm lamp pole
Docking: Hinge
TEMPTRONIC Chiller
Relay board
Power control board
Loader 5-Axis board
Stopper
Loader
VME Rack:
Slot 1: Master CPU
Slot 4: VGA Card
Slot 6: COGNEX Board
Slot 8: PIO Board
Slot 10: GPIB Board
Slot 11:5 CH PGEN Board
Slot 14: Disp sensor
Slot 16: Slave CPU
Slot 17: Loader I/O
Slot 18: Loader PGEN
Floppy disk
Loader side:
Loader driver board
Loader sensor board
Cassette cover
Elevator motor driver
Sub-chuck rotation motor driver
Turntable motor driver
(2) Transfer motor driver arms
Sub-chuck
Pre-alignment sensor
(2) Arms
Inspection tray
Temperature controller
Elevator / clamper
Control rack:
Z-Axis driver
X Servo driver
Y Servo driver
Missing parts:
MO Disk
Hard Disk Drive (HDD)
Main body driver board
Moire divider board
E2 Camera module
Keyboard control board
Chiller
Power supply: (2) 24 V, +12 V, -12 V, 5 V, +48 V
2000 vintage.
ACCRETECH / TSK UF 200 is a prober designed to provide wafer probing and test capabilities in a production environment. This prober is equipped with a 1000mm x 400mm travel range, and a maximum die size of 400mm square. TSK UF 200 can be used for a wide range of applications, including product testing, panel probing, and die probing. ACCRETECH UF200 is an advanced prober, with a host of features for reliable wafer probing and testing. The prober has a six-axis design, with a dual-axis X-Y table, an HI-Z pulse generator for wafer probing, and an angle adjuster for sample registration. It also has a high accuracy measuring equipment for reliable data collection and automated stage management. This prober has a fully programmable CNC control allowing for easy and fast maintenance on the system. ACCRETECH / TSK UF200 is designed with a high resolution, high speed digital vision unit (DVS), providing precise image analysis capability, and automatic defect inspection. Its advanced CCD capturing technology is suitable for various applications, such as thin film transistor inspection, automatic alignment, and wafer pattern matching. UF 200 also offers a complete production line management machine, which provides integrated control and monitoring of the entire tool. This prober is equipped with an in-process and post-process testing capability, allowing high speed, accurate measurements on any sample. Its in-process testing capabilities increase the wafer yield during production. Additionally, UF200's post-process testing feature applies a high voltage or current for accurate measures across the entire wafer surface. This prober also has a feature for quick alignment, detection and correction of any sample. TSK UF200 is designed for easy operation, allowing fast and accurate setup and operation. With a user- friendly interface, and graphical operator guidance, training and maintenance are efficient and uncomplicated. ACCRETECH UF 200 is also equipped with online data acquisition capabilities, allowing for real-time wafer information to be obtained directly from the asset. Overall, ACCRETECH / TSK UF 200 is an advanced prober with a wide range of features and applications. This prober is designed to provide reliable wafer probing and testing capabilities in a production environment, with a high-speed, accurate, and easy-to-use model.
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