Used ACCRETECH / TSK UF 200 #9091007 for sale

ACCRETECH / TSK UF 200 is a prober designed specifically for electrical and optical testing of integrated devices. The prober enables fast, precise testing of devices with a throughput up to 2000 samples/hour. The prober is an ideal choice for applications requiring quick and reliable device characterization. TSK UF 200 prober is a semi-automatic equipment that has been designed for the most demanding IC testing. It is a multi-site system which supports testing of multiple devices in the same test fixture or multiple devices in multiple test fixtures. The prober includes a base wafer carrier unit, an automated measurement machine, a stereo microscope, three probe arms, a 16-bit data acquisition tool and a variety of power sources. The base wafer carrier asset is coated with a low-vibration, non-magnetic material to reduce vibration of the probe needles and improve measurement result accuracy. The model is designed to reduce time and cost on the user side since it can accommodate various handling equipment such as die bonding, molding, and heat curing. At the same time, the equipment can rapidly scan wafers and efficiently measure multiple chip parameters with high accuracy. The automated measurement system facilitates precise probing of up to 2000 devices per hour in a LxWxH size of 640 x 750 x 250 mm. The automated unit contains a precise CCD camera with lens magnification and a fully automated mechanical stage. The precise height adjustments of the silicon wafer ensure the accurate alignment of probe needles and contacts. This ensures precise measurement of electrical parameters. The stereo microscope with 40x magnification is used for on-site die inspection. The unit effectively generates clear images with a depth of field of about 2.4 mm for precise identification of test points. The three probe arms are equipped with many robust and reliable N8/N4/N2 tips to ensure accurate contact during probing. They come with fixed or swivel tips to ensure flexible adjustments and precise probing of even the most delicate contacts. The 16-bit data acquisition machine is capable of accurately measuring parameters of devices down to nano-scale. The tool can measure up to 200 channels simultaneously and with a maximum sampling rate of 100 kHz and a resolution of 4 micro volts. The power sources enable the user to set different power supplies and enable precise testing of devices. With multiple outputs of low-noise and high-voltage power supplies, the user can accurately measure parameters including Vth, Idsat, carrier concentration, breakdown voltage and others. Overall, ACCRETECH UF200 prober is an ideal choice for applications requiring quick, reliable, and accurate electrical and optical device testing. The automated measurement asset can accurately measure multiple chip parameters at a rate of 2000 samples/hour. With a range of features such as stereo microscope, multiple probe arms, 16-bit data acquisition model, and a variety of power sources, the prober allows for maximum testing accuracy and flexibility.