Used ACCRETECH / TSK UF 200 #9151462 for sale

ACCRETECH / TSK UF 200 is an automated prober designed for electrical testing of semiconductor devices and other small components. It is designed for testing at the wafer and die level, with wafer chuck sizes up to 200mm in diameter. The equipment provides a wide range of probing capabilities, including contact, non-contact, near field and laser probing. The system is capable of high-speed probing and is designed for automated, in-line testing. The unit is made up of several components including the control unit, prober head, probing arm, prober chuck, and prober platform. The control unit operates the prober and houses the electronic components and transducers that transfer signals to the prober head. The prober head is the part of the unit which holds the probes and testing instruments. The prober chuck is connected to a linear actuator that is used to move and place parts to be tested onto the probe tips. The prober platform is used to support parts during testing, and can be customized to accommodate different sizes and types of components. TSK UF 200 automates the process of testing individual dies, providing an efficient method of testing and inspecting wafers in the production line. The automated control machine is designed for rapid testing, with speeds of up to 2500 tests per hour. For precise placement of the probes, the prober is equipped with a laser tool that directs the probe tips to the correct position. The unit also uses a asset of optical, measure aligners and sensors to facilitate accurate positioning of the probes. The model is also capable of verificative inspection, using video cameras and inspection software. This technology enables ACCRETECH UF200 to acquire image data which can then be compared against programmed parameters. If the data falls outside these parameters, the unit can identify defects in a component and take appropriate corrective action. UF 200 is a highly versatile equipment, capable of testing and inspecting numerous components like transistors, memory chips, logic chips, and opto-electronic components. Its advanced capabilities make it an ideal choice for those involved in semiconductor device testing and inspection.