Used ACCRETECH / TSK UF 200 #9171736 for sale

ACCRETECH / TSK UF 200 is a semiconductor prober designed to provide superior alignment accuracy, scratch free contact and a high degree of repeatability. It is designed to handle a wide range of applications, from small samples to high density multi-pins. The prober features a wafer chuck stage with sub-micrometer linear position accuracy, two sets of stacked chuck arms that allow for large wafer capacitance and a wafer platen holder with low weight and low thermal expansion coefficient material. This allows for superior alignment accuracy while maintaining scratch free contact with the sample. There is also a pedestal chuck base with a gap of 2 millimeters between the chuck and the sampling points, providing a lower thermal hassle and flexible sample operations. The prober is equipped with a closed loop control system with a resolution of 0.1 nanometer, which ensures high repeatability and stability during probing. It also includes an embedded feed-forward system to reduce thermal inertia effect and an air bearing which provides smooth operation and fast response response. TSK UF 200 also includes a built-in yield analysis system which makes use of real-time data to detect leaky and miswired chips. Additionally, it includes a real-time program launcher and a wide range of automation scripts for facilitating efficient automatic wafer probing. ACCRETECH UF200 is designed to provide high accuracy and repeatability in wafer probing, reducing the possibility of damaging the sample or damaging the prober itself. Additionally, it increases yield analysis and automation capabilities, allowing users to get more data in less time. It is an ideal solution for high volume or sensitive sample probing.