Used ACCRETECH / TSK UF 200 #9174808 for sale

ACCRETECH / TSK UF 200 is a prober specifically designed for the purpose of testing the electrical properties of nanometer-scaled devices. The prober offers high accuracies, superior sensitivity and a wide range of measurement techniques, making it an ideal choice for use in research, product prototyping and production testing environments. The prober's design is based on the concept of a "Force Controlled Probe (FCP)," which features feedback-controlled force between the device-under-test and probe tip. This design allows for precise and repeatable samples, resulting in extremely accurate measurements. The prober's slew-rate compensation feature helps ensure a low electrical loading of the sample device, thus avoiding any damage to the test object and ensuring high measurement precision. The prober is equipped with eight probe channels and can measure up to eight different electrical properties simultaneously. It offers a wide array of measurement techniques, including voltage, current and resistance data, as well as transistor characterization. Its 4-point measurement technique enables fast measurements and high stability across a broad range of samples, allowing for faster testing and improved accuracy. The prober produces high speed data acquisition of up to 5 kHz and features built-in memory for up to 16,000 point data sets. It also offers a variety of optional measurement accessories, such as temperature probes, high frequency compensation tools, sample holders and adapters for different sample shapes. TSK UF 200 is powered by an easy-to-use yet powerful software interface, which allows the user to customize measurement settings and access multiple graphical displays. It also includes several utility functions, such as measurement sharing, data simulation and data export capabilities. Overall, the prober delivers a high level of accuracy and usability for both research and development applications.