Used ACCRETECH / TSK UF 200 #9175609 for sale
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ID: 9175609
Vintage: 1998
Prober
Tri-temp probe: -45°C to 200°C
ERS Chuck, controller & chiller
ERS Air cool plus chiller 3 rev III
1998 vintage.
ACCRETECH / TSK UF 200 Prober is an advanced automated sample probing equipment designed for testing and measuring the electrical characteristics of devices. This system is designed for use in the semiconductor industry and can be used for probing and testing on a wide range of substrates such as wafers, films, foils, and laminates. The prober is equipped with a high-performance drive subsystem, advanced vision unit, and efficient automation. The high performance drive subsystem offers a smooth and reliable motion, while the advanced vision machine provides advanced neural networks to detect and acquire sample images. Furthermore, the tool offers intelligent motion control to control the motion of the probe arm and provide real-time trajectory tracking. It also includes an efficient wafer marking asset to precisely mark the wafer or substrate to ensure accurate test pattern data. The model has a highly automated setup process which ensures fast wafer loading, probe alignment, and subsequent calibration and metrology processes. In addition, the equipment offers a variety of accessories such as probes and hardware tools, enabling users to customize the system according to their application requirements. The unit also offers a variety of software control solutions, providing users with easy, intuitive control over the entire probing process. TSK UF 200 Prober is a reliable, efficient, and cost-effective production tool that can handle a wide range of substrate sizes, shapes, thicknesses, and substrate materials, making it an ideal solution for electronics and semiconductor probing, testing, and measuring applications. The machine is also designed for easy installation and offers accurate and reliable performance. With its intuitive software controls and reliable performance, ACCRETECH UF200 Prober is the ideal solution for high speed and reliable testing, probing, and characterization of devices in the semiconductor and electronics industry.
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