Used ACCRETECH / TSK UF 200 #9203169 for sale

ACCRETECH / TSK UF 200 is a prober that is used to analyze the electrical characteristics of integrated circuits (ICs). It can be used for a wide range of applications, including reliability testing, failure analysis, stress testing, signal integrity, signal integrity, and noise analysis. The prober can be used for both wafer-level and device-level probing. The prober utilizes a patented True Focus Probe Electrode technology that enables the high precision testing of very small ICs and other electronic components. The True Focus Probe Electrode is able to precisely locate and contact the pads on the IC with a significantly reduced number of vias needed for the mating of the electrodes. This reduces the amount of time it takes to perform testing and improves the accuracy of the results. TSK UF 200 also features dynamic probe height compensation, which allows for the compensation of any surface topography differences between different IC pads or structures. This ensures accurate electrical characterization and testing, regardless of surface topography. The prober is equipped with a highly reliable air-bearing stage and a closed-loop temperature control system to maintain consistent operating temperature. This improves testing accuracy and reliability. The prober also has an automatic test positioning system that can accurately move the prober needle over the desired test points. This eliminates potential alignment errors and ensures that the correct test points can be probed quickly and accurately. Finally, the prober is also equipped with a variety of accessories that can be used to customize the testing process. These include a database module, a data analysis module, a board manager module, and a pattern generator module. In conclusion, ACCRETECH UF200 is an advanced prober that offers a wide range of features and capabilities that are ideal for various applications, such as reliability testing, failure analysis, stress testing, signal integrity, and noise analysis. The prober has been designed to accurately detect and analyze very small ICs, while also providing reliable air-bearing stages, dynamic probe height compensation, and a closed-loop temperature control system. In addition, it can easily be customized with a variety of accessories.