Used ACCRETECH / TSK UF 200 #9229124 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 200
ID: 9229124
Vintage: 1998
Prober Gold chuck Hard Disk Driver (HDD) Floppy Disk Driver (FDD) Single cassette Fail mark inspection Needle inspection Auto needle alignment Auto needle height GB-IP Configuration disk Function check TTL Ethernet Cleaning option / WAPP: V (50 mm) Voltage: 220 VAC 1998 vintage.
ACCRETECH / TSK UF 200 is a tool for semiconductor manufacturers that is used for wafer probing. It is the world's fastest prober, providing high-speed probing with unsurpassed accuracy. TSK UF 200 prober is designed for wafers up to 200 mm and supports a wide variety of electrical tests, including DC IV and AC impedance measurements, gate leakage, high/low frequency resistance, and capacitance measurements. ACCRETECH UF200 prober is equipped with a high-resolution and high-sensitivity optical displacement equipment that allows for probing of 0.05mm or smaller dimensional coordinates. This system helps minimize errors and ensures a high level of accuracy and repeatability in probing. The prober is configured with a high-precision wafer support unit to accurately position the wafer in the test chamber and hold it in place during probing. A built-in heater helps to keep the wafer warm and stabilize temperatures within the chamber. It also comes with an air knife machine to dissipate particles that might affect probing accuracy. The prober is designed with a fully-enclosed four-axis pulse motor control unit that ensures smooth and accurate movement of the wafer during probing. The prober also supports the automatic lot indexing and barcode reader features to reduce setup time and allow for operation at maximum efficiency. TSK UF200 prober comes with a high-speed CPU and a large amount of RAM. It comes with a Linux operating tool, a Windows graphical user interface, and a variety of connectivity options. It can accommodate varying wafer sizes, with a wafer-loading speed of up to 1000 wpm (wafers per minute). ACCRETECH UF 200 prober is designed for high-speed, high-precision wafer probing. It offers an extensive range of testing and measurement capabilities, with a comprehensive suite of software tools to help users achieve optimal efficiency and repeatability in their manufacturing process.
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